第6卷‧第5期,
197805
, pp. 438-447
光學干涉濾光片之研製與測量
- 作者:
盧三彥
- 作者服務機構:
國立臺灣大學物理學系
- 中文摘要:
光學薄膜是控制光束光譜之有力工具,其對於科學研究與工商用途而言為不可或缺者,因此國內已有數研究機構就其製作展開研究,期能達到完美自製之目的。本文首先概要地介紹光學薄膜之物理理論基礎及設計方援,主要重點則在於介紹製作光學薄膜之技術與測量方法,並對筆者現行方法做一評估。
- 英文摘要:
Optical thin film can be used as a powerfultool for controlling the spectrum of light beam,which is important in scientific research andcommercial-industrial application. For this rea-son, there are several institutes in the Republicof China that have begun the study of opticalthin film. In this report, the physical basis anddesign method of optical thin film is roughlyreviewed. The main purpose is to introduce thetechnique of manufacture and measurement ofoptical thin film that have been developed inNational Taiwan University.
- 中文關鍵字:
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- 英文關鍵字:
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