- 作者: 翁金輅
- 作者服務機構: 國立中山大學電機工程學系
- 中文摘要: 在這篇報告中,我們探討一電磁脈波入射至積體電路所造成之電磁干擾影響。數值結果顯示:當電磁脈波入射至電路時,部分能量可為電路中之基底(substrate)所吸收。而能量吸收大小與入射角,電磁脈波之時間(duration)及基體導電率有關。當基體於高度摻雜(heavily doping)時,有超過10%的能量可被基體所吸收,而同時幾乎有90%的能量可在空氣-基體界面上流動。此結果顯示,電磁脈波對積體電路的電磁干擾影響不可忽視。而同時我們也發現:降低基體的厚度可以有效的減少電磁脈波的電磁干擾。
- 英文摘要: An electromagnetic pulse incident on the air-dielectric interface of a three-layer model for integratedcircuits is studied. Numerical results showing the energy absorption by the model as a function of incidentangle, duration of the EMP, and substrate conductivity are presented. It is found that over 10% of theenergy of the incident EMP can be absorbed by the substrate material when the substrate is heavily doped,and that almost 90% of the energy of the incident EMP can be induced on the air-dielectric surface duringthe reflection of the EMP by the boundary. These results suggest that the electromagnetic interferenceof the EMP incident on integrated circuits can not be ignored, and that reducing the width of the substrateregion can effectively limit the electromagnetic interference of EMP's.
- 中文關鍵字: electromagnetic interference; integrated circuits
- 英文關鍵字: --