• 作者： 楊竹星; 吳順裕
• 作者服務機構： 中山大學資訊工程研究所; 中山大學電機工程研究所
• 中文摘要： 本論文宗旨在於設計能夠容忍點（處理器）故障的布林n－晶格架構，稱之為容錯布林n－晶格。就目前已提出有關此類容錯布林n－晶格設計當中，多數需要龐大的硬體費用，如此在很多應用是不切實際的。本論文中擬將提出的容錯布林n－晶格，與相關論文比較時，只需較低硬體費用就能達成一樣的系統可靠度。此架構乃由容錯模組所組成，而每一容錯模組包含2m個原始點與k個備用點，且每一備用點於模組內可用來取代任意故障點（含原始點與備用點），此乃隱含著，模組內可達成備用點之完全使用率。此外，我們說明系統故障之重建程序簡單又快速，亦即，系統重建只需很少時間。
• 英文摘要： The goal of the paper is to design Boolean n-cube architectures that can tolerate node (processor) failures,called fault-tolerant Boolean n-cubes. While a number of such fault-tolerant Boolean n-cube designs have beenpreviously proposed, most of these designs usually require large hardware overhead, which may be not practicalin many applications. In this paper, we present a new approach to the design of fault-tolerant Boolean n-cubesthat can achieve the same reliability as some previous schemes while requiring less hardware overhead. We firstbuild a fault-tolerant module containing 2m original nodes with k spare nodes, and then construct the fault-tolerantBoolean n-cube by using a number of such modules. In each module, every spare node can replace any otheroriginal or spare node failure. Hence, full spare utilization is achieved in each module. Furthermore, the proposedreconfiguration procedure can be done simply and quickly; i.e., only short time overhead is required duringreconfiguration.
• 中文關鍵字： Boolean n-cube; facult-tolerant Boolean n-cube;facult-tolerant module; reconfiguration; reliability
• 英文關鍵字： --