- 作者: Subhendu Sarkar and Purushottam Chakraborty
- 中文摘要:
Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Calcutta 700 064, India
The matrix effect in a secondary ion mass spectrometry (SIMS) depth profile can distinctly represent any change in the chemistry of surface or interface regions of thin films or multilayered structures. Present work shows how a preferential incorporation of oxygen in metallic multilayered structures has been manifested by such an analysis. - 英文摘要: --
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