- 作者: 陳保川; 郭達源; 王駿發; 劉濱達
- 作者服務機構: 國立成功大學電機工程研究所
- 中文摘要: 於本論文中,提出一套可謂具智慧性序向電路測試信號產生系統。此系統以模擬式導向搜尋法為主,定義了以最短輸出距離(MOD)為主的成本函數做為導向搜尋的指標。有鑑於序向電路之行為不僅與主要輸入有關且與電路之內部狀態有關,因此在導向搜尋之過程中,不能不把狀態的因素考慮進去。於是又定義了另一導向指標-狀態導向成本函數。此種做法有將邏輯閘層次與狀態圖層次混合考慮的觀念存在。此外,又提出了一套學習導向策略,將模擬後的結果加以學習並記錄產生一些有用的資訊,以便配合使用於導向及迴路的跳脫,進而縮短測試信號的長度。經由實驗結果顯示,驗証了本系統之成效。
- 英文摘要: In this paper, an intelligent test generation system for sequential circuits is presented. The systemadopts the simulation-based directed-search method and uses the MOD (Minimum Output Distance) basedcost function. Since the behavior of sequential circuits depends not only on primary inputs but also oninternal states, another searching guidance, the state-directed cost function, is defined to involve the consi-deration of internal states. In the process of cost reduction, the internal states are somtimes trapped in aloop, especially when a local minimum is arrived at. Therefore, a learning directed strategy is introduced.Based on this learning strategy, some useful messages can be learned from every simulation result. Toreduce the test length, these messages are used to skip loops while the trial vector is trapped in a state loop.Finally, a PODEM-like approach is introduced to deal with the cost reduction process. Experimental resultsshow the efficiency of this system.
- 中文關鍵字: simulation-based directed-search method; minimum output distance; state-directed cost
- 英文關鍵字: --