- 作者: 林雨平 ; 凌永健
- 作者服務機構: 清華大學化學系
- 中文摘要: Results from static SIMS analysis of six thermoplastic polymers---polytetrafluoroethylene (PTFE), polyethylene (PE), polymethyl methacrylate (PMMA), polyethylene terephthalate (PET), polystyrene (PS) and polycarbonate (PC)---using a magnetic-sector SIMS instrument and O/sub 2//sup +/ primary beam are presented. For PTFE as a representative sample, the charging effect is reduced only with a metal grid when analyzing positive secondary ions. When negative secondary ions are analyzed, excessive charges are self-compensated with a normal- incidence electron gun. Positive-ion spectra collected agree with spectra obtained using either a quadrupole or time-of-flight SIMS instrument and noble-gas ion beams. The agreement is objectively demonstrated by means of the capability to compare spectra in the NIST/EPA/MSDC mass spectral database. The merits of the use of high-mass resolution, of which magnetic-sector SIMS is inherently capable, to provide analytical information about the molecular species native to the sample are demonstrated in distinguishing three ambiguous peaks with nominal mass ratios m/z=27, 39 and 59 from PMMA.
- 英文摘要: --
- 中文關鍵字: Magnetic-Sector Sims; Polymer; Charge; Similarity Index; Static Secondary Ion Mass Spectrometry (Static Sims)
- 英文關鍵字: 磁矩二級離子質譜分析;聚合物;充電;類似指數;靜態二級離子質譜分析