• 作者： 張哲政
• 作者服務機構： 台灣大學化學系
• 中文摘要： The application of secondary particle mass spectrometry to analyze the atomic bonding configuration on a surface was investigated with computer calculations of particle sputtering from an Ar-bombarded surface of Ag.lbrace.111.rbrace.. In contrast to the prediction from the present sputtering theory, better resolved structure in the angular distribution was not observed for particles of high energy sputtered from the surface. These particles ejected to a wide angle and their angular distribution may not reflect well the atomic bonding geometry on the surface. The analytical capability of secondary particle mass spectrometry to determine surface structures can be significantly improved by selecting for detection only those particles that have prolonged collisions. The preferred directions of ejection and the relative sputtering intensity in the distribution of azimuthal angle between major open channels on the surface vary insignificantly with the duration of collision in the regime of long collisions. The results provide the first evidence that at small energies of sputtering the particles emitted from the surface may contain information about only the top two surface layers. Secondary particle mass spectrometry can thus be extremely surface sensitive for analysis of properties of solid surfaces.
• 英文摘要： --
• 中文關鍵字： Secondary Particle Mass Spectrometry; Surface Analysis; Sputtering Theory; Molecular Dynamics
• 英文關鍵字： 二級粒子質譜測定術；表面分析；濺射理論；分子動力學