- 作者: 葉闓笙; 張富昌; 葉有財; 吳紹起
- 作者服務機構: Institute of Nuclear Energy Research, Atomic Energy Council, P.O. Box 3-19, Lung-Tan, Taiwan 325
- 中文摘要:
An emission spectrographic method for the quantitative determination of 17 trace elements un high-purity lanthanum oxide has been developed. The sample was ignited in muffle furnace at 850° for one hour to remove the moisture and carbon dioxide, then blended with equal amount of graphite and 10 mgs of this mixture was taken into electrodes. A 10 amps dc arc was employed to excite the mixture and a 3.4 meter Ebert Spectrograph with 15,000 LPI plane grating was used to record the spectrum in the region 2,200 at 3,400A. The weak line of lanthanum was used as an internal standard. The working ranges of these elements were: Ag, Mg 0.5 to 50 ppm; Be 0.5 to 100 ppm; V, Cr 1 to 100 ppm; Cu, Sn, Fe 3 to 100 ppm; Ge, Mn, Ni 5 to 100 ppm; B, Co, Pb, Sb 10 to 100 ppm; Ca and Si 30 to 500 ppm. The precisions fell in the range of 10 to 24%.
Sample obtained from Engineering Research Laboratory (ERL) of Institute of Nuclear Energy Research were also examined. - 英文摘要: --
- 中文關鍵字: --
- 英文關鍵字: --