• 作者： 鄭儒強
• 中文摘要： This report of research is to figure outthe interface reaction between the thick filmresistor and its conductor. To study the eff-ect of the interface reaction between theresistor and its conductor manufactured underthree different temperatures. The results ofthe test are as follows: by low temperature,the resistance of the thick resistor is unst-able; by high temperature, there are diffusephenomenon at the interface, and the resist-ance of the resistor is less than of the re-sistor as before; the resistance of the thickfilm resistor manufactured under very hightemperature can not be controlled. i.e., thetemperature must be attended to when thethick film resistor is manufactured.
• 英文摘要： --
• 中文關鍵字： --
• 英文關鍵字： --